Browsing by author "Zhang, W"

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Characterization of electron traps in Si-capped Ge MOSFETs with HfO2/SiO2 gate stack

Benbakhti, B.; Zhang, J.F.; Li, Z.; Zhang, W; Mitard, Jerome; Kaczer, Ben; Groeseneken, Guido; Hall, S.; Robertson, J.; Chalker, P. (2012)
Evidence of filamentary switching and relaxation mechanisms in GexSe1-x OTS selectors

Degraeve, Robin; Chai, Zheng; Zhang, W; Clima, Sergiu; Hatem, F; Zhang, JF; Freitas, P; Marsland, J; Fantini, Andrea; Garbin, Daniele; Goux, Ludovic; Kar, Gouri Sankar (2019)