Browsing by author "Hou, A."

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Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics

Kerber, Andreas; Cartier, Eduard; Pantisano, Luigi; Degraeve, Robin; Kauerauf, Thomas; Kim, Young-Chang; Hou, A.; Groeseneken, Guido; Maes, Herman; Schwalke, U. (2003)