Browsing by author "Dultsev, F. N."
Now showing items 1-4 of 4
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Calculation of pore size distribution in the ellipsometric porosimetry: method and reliability
Mogilnikov, K. P.; Polovinkin, V. G.; Dultsev, F. N.; Baklanov, Mikhaïl (2000) -
Determination of pore size distribution in thin films by ellipsometric posimetry
Baklanov, Mikhaïl; Mogilnikov, K. P.; Polovinkin, V. G.; Dultsev, F. N. (2000) -
Development of a non-destructive thin film porosimetry: pore size distribution and pore volume of porous silica
Baklanov, Mikhaïl; Dultsev, F. N.; Kondoh, Eiichi; Mogilnikov, K. P.; Maex, Karen; Wang, Sharon; Forester, Lynn (1999) -
Nondestructive determination of pore size distribution in thin films deposited on solid substrates
Dultsev, F. N.; Baklanov, Mikhaïl (1999)