Browsing by author "Vandenberghe, S."
Now showing items 1-20 of 37
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A 16-24 GHa InP HEMT medium power amplifier
Vandenberghe, S.; Schreurs, Dominique; van der Zanden, Koen; Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter (1998) -
A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; Vandenberghe, S.; De Roest, David (2002) -
A design-oriented scaleable MMIC spiral inductor model
Carchon, Geert; Schreurs, Dominique; Vandenberghe, S.; Nauwelaers, Bart; De Raedt, Walter (1998) -
Accurate analytic expressions for frequency-dependent inductance and resistance of single on-chip interconnects on conductive silicon Substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; De Roest, David; Vandenberghe, S. (2002) -
Accurate measurement and characterization of MCM-D integrated passives up to 50 GHz
Carchon, Geert; Brebels, Steven; Vaesen, Kristof; Pieters, Philip; Schreurs, Dominique; Vandenberghe, S.; De Raedt, Walter; Nauwelaers, Bart; Beyne, Eric (2000) -
Admittance matrix calculations of on-chip interconnects on lossy silicon substrate using multilayer Green's function
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; De Roest, David; Vandenberghe, S.; Stucchi, Michele (2001) -
Advanced non-linear InP HEMT model parameter estimation from vectorial large-signal measurements
Schreurs, Dominique; Verspecht, J.; Vandenberghe, S.; van der Zanden, Koen; Carchon, Geert; Nauwelaers, Bart (1999) -
Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs
Schreurs, Dominique; Vandamme, Ewout; Vandenberghe, S.; Carchon, Geert; Nauwelaers, Bart (2000) -
CAD-oriented analytic formulas for self and mutual capacitance of interconnects on an Si-SiO2 substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; Vandenberghe, S.; De Roest, David; Stucchi, Michele (2001) -
Characterising differences between measurement and calibration wafer in probe-tip calibrations
Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter; Schreurs, Dominique; Vandenberghe, S. (1999) -
Characteristic impedance extraction using calibration comparison
Vandenberghe, S.; Schreurs, Dominique; Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter (2001) -
Compensating differences between measurement and calibration wafer in probe-tip calibrations - deembedding of line parameters
Carchon, Geert; Schreurs, Dominique; Vandenberghe, S.; Nauwelaers, Bart; De Raedt, Walter (1998) -
Design of a Ka- and V-band low noise amplifier MMIC in coplanar waveguide technology
Carchon, Geert; Philibert, Wim; Schreurs, Dominique; Vandenberghe, S.; van der Zanden, Koen; De Raedt, Walter; Nauwelaers, Bart (1999) -
Design of microwave MCM-D CPW quadrature couplers and power dividers in X-, Ku-, and Ka-band
Carchon, Geert; Brebels, Steven; Pieters, Philip; Vaesen, Kristof; Schreurs, Dominique; Vandenberghe, S.; De Raedt, Walter; Nauwelaers, Bart; Beyne, Eric (2000) -
Design-oriented measurement-based scaleable models for multilayer MCM-D integrated passives. Implementation in a design library offering automated layout
Carchon, Geert; Pieters, Philip; Vaesen, Kristof; Brebels, Steven; Schreurs, Dominique; Vandenberghe, S.; De Raedt, Walter; Nauwelaers, Bart; Beyne, Eric (2000) -
Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements
Schreurs, Dominique; Verspecht, J.; Vandenberghe, S.; Carchon, Geert; van der Zanden, Koen; Nauwelaers, Bart (1999) -
Evaluation of non-linear modelling techniques for MOSFETs based on vectorial large-signal measurements
Schreurs, Dominique; Vandenberghe, S.; Carchon, Geert; Nauwelaers, Bart; Vandamme, Ewout; Badenes, Gonçal; Deferm, Ludo (2000) -
Frequency-dependent expressions for inductance and resistance of microstrip line on silicon substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; De Roest, David; Vandenberghe, S. (2002) -
Frequency-dependent line capacitance and conductance calculations of on-chip interconnects on silicon substrate using Fourier cosine series approach
Ymeri, Hasan; Nauwelaers, Bart; Vandenberghe, S.; Maex, Karen; De Roest, David; Stucchi, Michele (2001) -
HEMT parameter extraction combining optimization and direct parasitic extraction
Vandenberghe, S.; Schreurs, Dominique; van der Zanden, Koen; Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter (1998)