Browsing by author "Geyer, Bert"

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Extended qualification testing of 1-cell crystalline Si PV laminates: impacts of advanced cell metallization and encapsulation schemes

Govaerts, Jonathan; Geyer, Bert; van der Heide, Arvid; Borgers, Tom; Hellstrom, Stefan; Broeders, Bert; Voroshazi, Eszter; Szlufcik, Jozef; Poortmans, Jef (2017-09)