Browsing by author "Fieback, Moritz"
Now showing items 1-4 of 4
-
Defect and Fault Modeling Framework for STT-MRAM Testing
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Medeiros, Guilherme Cardoso; Fieback, Moritz; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Device Aware Diagnosis for Unique Defects in STT-MRAMs
Aouichi, Ahmed; Yuan, Sicong; Fieback, Moritz; Rao, Siddharth; Kim, Woojin; Marinissen, Erik Jan; Couet, Sebastien; Taouil, Mottaqiallah; Hamdioui, Said (2023) -
Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Yuan, Sicong; Taouil, Mottaqiallah; Fieback, Moritz; Xun, Hanzhi; Marinissen, Erik Jan; Kar, Gouri Sankar; Rao, Siddharth; Couet, Sebastien; Hamdioui, Said (2023) -
Device-aware test: A new test approach towards DPPB
Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11)