Device-aware test: A new test approach towards DPPB

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Authors
Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said
Conference
IEEE International Test Conference (ITC) 2019
Title
Device-aware test: A new test approach towards DPPB
Publication type
Proceedings paper
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