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Device-aware test: A new test approach towards DPPB
Publication:
Device-aware test: A new test approach towards DPPB
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fieback, Moritz
;
Wu, Lizhou
;
Cardoso Medeiros, Guilherme
;
Aziza, Hassen
;
Rao, Siddharth
;
Marinissen, Erik Jan
;
Taouil, Mottaqiallah
;
Hamdioui, Said
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1921
since deposited on 2021-10-27
Acq. date: 2026-07-17
Citations
Statistics
Views
1921
since deposited on 2021-10-27
Acq. date: 2026-07-17
Citations