Browsing by author "Sob, M."
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Study of point defects in silicon by means of positron annihilation with core electrons
Kuriplach, J.; Van Hoecke, T.; Van Waeyenberge, B.; Dauwe, C.; Segers, D.; Balcaen, N.; Morales, A. L.; Trauwaert, Marie-Astrid; Vanhellemont, Jan; Sob, M. (1997)