Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Study of point defects in silicon by means of positron annihilation with core electrons
Publication:
Study of point defects in silicon by means of positron annihilation with core electrons
Date
1997
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
1946.pdf
161.28 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kuriplach, J.
;
Van Hoecke, T.
;
Van Waeyenberge, B.
;
Dauwe, C.
;
Segers, D.
;
Balcaen, N.
;
Morales, A. L.
;
Trauwaert, Marie-Astrid
;
Vanhellemont, Jan
;
Sob, M.
Journal
Abstract
Description
Metrics
Views
1918
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1918
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations