Browsing by author "Monfray, S."
Now showing items 1-4 of 4
-
An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies
Diouf, C.; Cros, A.; Monfray, S.; Mitard, Jerome; Rosa, J.; Gloria, D.; Ghibaudo, G. (2012) -
Dielectric pockets - a new concept of the junctions for deca- nanometric CMOS devices
Jurczak, Gosia; Skotnicki, T.; Gwoziecki, R.; Paoli, M.; Tormen, B.; Ribot, P.; Dutartre, D.; Monfray, S.; Galvier, J. (2001) -
Electrical transport characterization of nano CMOS devices with ultra-thin silicon film
Ghibaudo, G.; Mouis, M.; Pham-Nguyen, L.; Bennamane, K.; Pappas, I.; Cros, A.; Bidal, G.; Fleury, D.; Claverie, A.; Benassayag, G.; Fazzini, P.-F.; Fenouillet-Beranger, C.; Monfray, S.; Boeuf, F.; Cristoloveanu, S.; Skotnicki, T.; Collaert, Nadine (2009) -
Y function method applied to saturation regime: apaprent saturation mobility and saturation velocity extraction
Diouf, C.; Cros, A.; Monfray, S.; Mitard, Jerome; Rosa, S.; Gloria, D.; Ghibaudo, G. (2013)