Browsing by author "Kimura, Kenji"
Now showing items 1-4 of 4
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Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states
Kimura, Kenji; Nakajima, Kaoru; Zhao, Ming; Nohira, Hiroshi; Hattori, Takeo; Kobata, Masaaki; Ikenaga, Eiji; Kim, Jung Jin; Kobayashi, Keisuku; Conard, Thierry; Vandervorst, Wilfried (2008) -
Does NIST database provide reliable effective attenuation lenght for XPS analysis
Nakajima, K.; Kimura, Kenji; Conard, Thierry; Vandervorst, Wilfried (2007) -
Influence of elastic scattering of photoelectrons on angle-resolved x-ray photoelectron spectroscopy
Kimura, Kenji; Nakajima, Kaoru; Conard, Thierry; Vandervorst, Wilfried (2007-09) -
The analysis of ultra-thin films with HRBS-30
Brijs, Bert; Kimura, Kenji; Schiettekatte, Francois; Sajavaara, Timo; Vandervorst, Wilfried (2010)