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Does NIST database provide reliable effective attenuation lenght for XPS analysis
Publication:
Does NIST database provide reliable effective attenuation lenght for XPS analysis
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nakajima, K.
;
Kimura, Kenji
;
Conard, Thierry
;
Vandervorst, Wilfried
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1934
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-09
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Metrics
Views
1934
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-09
Citations