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Does NIST database provide reliable effective attenuation lenght for XPS analysis
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Authors
Nakajima, K.
;
Kimura, Kenji
;
Conard, Thierry
;
Vandervorst, Wilfried
Conference
6th International Symposium on Atomic Level Characterizations - ALC
Title
Does NIST database provide reliable effective attenuation lenght for XPS analysis
Publication type
Oral presentation
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