Publication:

Does NIST database provide reliable effective attenuation lenght for XPS analysis

Date

2007
Presentation
Simple item page Full metadata Statistics
 
dc.contributor.authorNakajima, K.
dc.contributor.authorKimura, Kenji
dc.contributor.authorConard, Thierry
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.date.accessioned2021-10-16T18:07:01Z
dc.date.available2021-10-16T18:07:01Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12608
dc.source.conference6th International Symposium on Atomic Level Characterizations - ALC
dc.source.conferencedate29/10/2007
dc.source.conferencelocationKanazawa Japan
dc.title

Does NIST database provide reliable effective attenuation lenght for XPS analysis

dc.typeOral presentation
dspace.entity.typePublication
Files
Publication available in collections:
Presentations