Browsing by author "Lyu, Jeong-ho"
Now showing items 1-9 of 9
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Explanation of the "long distance" Vt roll-off in deep submicron nMOS transistors with Indium channel
Kubicek, Stefan; Lyu, Jeong-ho; De Meyer, Kristin (1998) -
High performance raised gate/source/drain transistors for sub-0.15 μm CMOS technologies
van Meer, Hans; Kubicek, Stefan; Lyu, Jeong-ho; Caymax, Matty; Loo, Roger; De Meyer, Kristin (1999) -
Investigation of the threshold voltage difference between partially-depleted SOI and bulk CMOS transistors
van Meer, Hans; Lyu, Jeong-ho; Kubicek, Stefan; De Meyer, Kristin (1999) -
Limitations of shift-and-ratio based Leff extraction techniques for MOS transistors with halo or pocket implants
van Meer, Hans; Henson, Kirklen; Lyu, Jeong-ho; Rosmeulen, Maarten; Kubicek, Stefan; Collaert, Nadine; De Meyer, Kristin (2000) -
On the impact of indium and boron on the Reversed Narrow-Channel Effects (RNCE) in BULK and SOI MOSFETs
van Meer, Hans; Lyu, Jeong-ho; Kubicek, Stefan; De Meyer, Kristin (1999) -
Optimization of nMOS high-frequency transistor characteristics for application in MMIC's
van Meer, Hans; Kubicek, Stefan; Schreurs, Dominique; Lyu, Jeong-ho; Nauwelaers, Bart; De Meyer, Kristin (1998) -
Performance of 0.1 μm partially-depleted SOI CMOS: a comparison to bulk
van Meer, Hans; Lyu, Jeong-ho; De Meyer, Kristin (2000) -
Threshold voltage design incompatibility between partially-depleted SOI and bulk CMOS transistors
van Meer, Hans; Lyu, Jeong-ho; Kubicek, Stefan; Geenen, Luc; De Meyer, Kristin (1999) -
Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies
Schreurs, Dominique; Vandenberghe, S.; Nauwelaers, Bart; van Meer, Hans; Lyu, Jeong-ho; Kubicek, Stefan; De Meyer, Kristin (1999)