Browsing by author "Feijoo, Pedro C."
Now showing items 1-2 of 2
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Positive bias temperature instabilities on sub-nanometer EOT FinFETs
Feijoo, Pedro C.; Cho, Moon Ju; Togo, Mitsuhiro; San Andrés, Enrique; Groeseneken, Guido (2011) -
Time-dependent dielectric breakdown on subnanometer EOT nMOS FinFETs
Feijoo, Pedro C.; Kauerauf, Thomas; Toledano Luque, Maria; Togo, Mitsuhiro; San Andrés, Enrique; Groeseneken, Guido (2012)