Browsing by author "Kossionides, E."
Now showing items 1-5 of 5
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Degradation of deep submicron partially depleted SOI CMOS transistors under MeV proton irradiation
Simoen, Eddy; Rafi, Joan Marc; Mercha, Abdelkarim; De Meyer, Kristin; Claeys, Cor; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Mohammadzadeh, A. (2003) -
DLTS and PL studies of proton radiation defects in TiN-doped FZ silicon
Simoen, Eddy; Claeys, Cor; Privitera, Vittorio; Coffa, S.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Larsen, A. N.; Clauws, P. (2002) -
DLTS PL studies of proton radiation defects in tin-doped FZ silicon
Simoen, Eddy; Claeys, C.; Privitera, Vittorio; Coffa, S.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Nylandsted Larsen, A.; Clauws., P. (2001) -
High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori; Takizawa, H.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Mohammadzadeh, A. (2000) -
Radiation damage in deep submicron partially depleted SOI CMOS
Simoen, Eddy; Rafi, Joan Marc; Mercha, Abdelkarim; Serra-Gallifa, Xavier; van Meer, Hans; De Meyer, Kristin; Claeys, Cor; Kokkoris, M.; Kossionides, E.; Fanourakis, G. (2003)