Browsing by author "Da Rold, Martina"
Now showing items 1-9 of 9
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A 0.35μm SiGe BiCMOS process featuring a 80 GHz Fmax HBT and integrated high-Q RF passive components
Decoutere, Stefaan; Vleugels, Frank; Kuhn, Rudiger; Loo, Roger; Caymax, Matty; Jenei, Snezana; Croon, Jeroen; Van Huylenbroeck, Stefaan; Da Rold, Martina; Rosseel, Erik; Chevalier, P.; Coppens, P. (2000) -
CMOS device optimisation for mixed-signal technologies
Stolk, Peter; Tuinhout, Hans; Duffy, Ray; Augendre, Emmanuel; Bellefroid, L. P.; Bolt, M. J. B.; Croon, Jeroen; Dachs, Charles; Huisman, F. R. J.; Moonen, A. J.; Ponomarev, Youri; Roes, R. F. M.; Da Rold, Martina; Seevinck, E.; Sreerambhatla, K. N.; Surdeanu, Radu; Velghe, Rudolf; Vertregt, M.; Webster, M. N.; van Winkelhoff, N. K. J.; Zegers-Van Duijnhoven, A. T. A. (2001) -
Flicker noise in submicron MOSFETS with 3.5 nm nitrided gate oxide
Simoen, Eddy; Da Rold, Martina; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N. (2001) -
Gate dielectrics for high performance and low power CMOS SoC applications
Cubaynes, Florence; Dachs, Charles; Detcheverry, Celine; Zegers, A.; Venezia, Vincent; Schmitz, Jurriaan; Stolk, Peter; Jurczak, Gosia; Henson, Kirklen; Degraeve, Robin; Rothschild, Aude; Conard, Thierry; Pétry, Jasmine; Da Rold, Martina; Schaekers, Marc; Badenes, Gonçal; Date, L.; Pique, D.; Al-Shareef, H.; Murto, R. (2002) -
Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS
Da Rold, Martina; Simoen, Eddy; Mertens, S.; Schaekers, Marc; Badenes, Gonçal; Decoutere, Stefaan (2001) -
Impact of nitridation of SiO2 gate oxide on 1/f noise in 0.18μm CMOS
Da Rold, Martina; Simoen, Eddy; Badenes, Gonçal; Decoutere, Stefaan (2000) -
NO oxides for low noise 0.18μm analog CMOS
Da Rold, Martina; Simoen, Eddy; De Jaeger, Brice; Lietaer, Nicolas; Rothschild, Aude; De Keersgieter, An; Decoutere, Stefaan (2001) -
On the basic correlation between polysilicon resistor linearity, matching and 1/f noise
Da Rold, Martina; Van Huylenbroeck, Stefaan; Knuts, Bruno; Simoen, Eddy; Decoutere, Stefaan (1999) -
Study of breakdown effects in silicon multiguard structures
Da Rold, Martina; Bacchetta, N.; Bisello, D.; Paccagnella, A.; Dalla Betta, G. F.; Verzellesi, G.; Militaru, O.; Wheadon, R.; Fuochi, P. G.; Bozzi, C.; Dell'Orso, R.; Messineo, A.; Tonelli, G.; Verdini, P. G. (1999)