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Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS
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Authors
Da Rold, Martina
;
Simoen, Eddy
;
Mertens, S.
;
Schaekers, Marc
;
Badenes, Gonçal
;
Decoutere, Stefaan
Issue
12
Journal
Microelectronics Reliability
Volume
41/42
Title
Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS
Publication type
Journal article
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