Publication:
Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS
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1935 since deposited on 2021-10-14
1last month
Acq. date: 2026-02-26
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Statistics
Views
1935 since deposited on 2021-10-14
1last month
Acq. date: 2026-02-26
Citations