Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS

Publication:

2001

Journal article

Author(s)

Da Rold, Martina

;

;

Mertens, S.

;

;

Badenes, Gonçal

;

Microelectronics Reliability

1936 since deposited on 2021-10-14

1last month

Acq. date: 2026-04-08