Browsing by author "Moonen, R."
Now showing items 1-2 of 2
-
Lifetime modeling of intrinsic gate oxide breakdown at high temperature
Moonen, R.; Vanmeerbeek, P.; Lekens, Geert; De Ceuninck, Ward; Moens, P.; Boutsen, J. (2007) -
Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature
Moonen, R.; Vanmeerbeek, P.; Lekens, Geert; De Ceuninck, Ward; Moens, P.; Boutsen, J. (2007)