Browsing by author "Saeys, Yvan"
Now showing items 1-11 of 11
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A study on the calibration of fingerprint classifiers
Peralta, Daniel; Tang, Lin; Lippeveld, Maxim; Saeys, Yvan (2021) -
An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
Roels, Joris; Vernaillen, Frank; Kremer, Anna; Gonçalves, Amanda; Aelterman, Jan; Luong, Hiep; Goossens, Bart; Philips, Wilfried; Lippens, Saskia; Saeys, Yvan (2020) -
An Introduction to Adversarially Robust Deep Learning
Peck, Jonathan; Goossens, Bart; Saeys, Yvan (2024) -
An overview of state-of-the-art image restoration in electron microscopy
Roels, Joris; Aelterman, Jan; Luong, Hiep; Lippens, Saskia; Pizurica, Aleksandra; Saeys, Yvan; Philips, Wilfried (2018) -
Calibrated multi-probabilistic prediction as a defense against adversarial attacks
Peck, Jonathan; Goossens, Bart; Saeys, Yvan (2019) -
Convolutional neural network pruning to accelerate membrane segmentation in electron microscopy
Roels, Joris; De Vylder, Jonas; Aelterman, Jan; Saeys, Yvan; Philips, Wilfried (2017) -
Detecting adversarial examples with inductive Venn-ABERS predictors
Peck, Jonathan; Goossens, Bart; Saeys, Yvan (2019) -
Domain adaptive segmentation in volume electron microscopy imaging
Roels, Joris; Hennies, Julian; Saeys, Yvan; Philips, Wilfried; Kreshuk, Anna (2019) -
IncGraph: Incremental graphlet counting for topology optimisation
Cannoodt, Robrecht; Ruyssinck, Joeri; Ramon, Jan; De Preter, Katleen; Saeys, Yvan (2018-04) -
Lower bounds on the robustness to adversarial perturbations
Peck, Jonathan; Roels, Joris; Goossens, Bart; Saeys, Yvan (2017) -
Regional image perturbation reduces Lp norms of adversarial examples while maintaining model-to-model transferability
Özbulak, Utku; Peck, Jonathan; De Neve, Wesley; Goossens, Bart; Saeys, Yvan; Van Messem, Arnout (2020)