Browsing by author "El-Sayed, A.M."

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Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs

Makarov, A.; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Vandemaele, Michiel; Hellings, Geert; El-Sayed, A.M.; Jech, M.; Grasser, T.; Linten, Dimitri; Tyaginov, Stanislav (2020)