Authors

Makarov, A.; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Vandemaele, Michiel; Hellings, Geert; El-Sayed, A.M.; Jech, M.; Grasser, T.; Linten, Dimitri; Tyaginov, Stanislav

Conference

International Conference on Solid-State Devices and Materials - SSDM

Title

Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs

Publication type

Proceedings paper

Embargo date

9999-12-31