Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs
1326