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Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs
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1870 since deposited on 2021-10-29
1last month
Acq. date: 2025-12-11
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Views
1870 since deposited on 2021-10-29
1last month
Acq. date: 2025-12-11
Citations