Browsing by author "Beckers, Arnout"
Now showing items 1-8 of 8
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A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Grill, Alexander; Michl, J.; Diaz Fortuny, Javier; Beckers, Arnout; Bury, Erik; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; De Greve, Kristiaan (2023) -
Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study
Prasad, Divya; Vangala, Manoj; Bhargava, Mudit; Beckers, Arnout; Grill, Alexander; Tierno, Davide; Nathella, Krishnendra; Achuthan, Thanusree; Pietromonaco, David; Myers, James; Walker, Matthew; Parvais, Bertrand; Cline, Brian (2022) -
Energy filtering in silicon nanowires with a geometric superlattice for steep-slope transistors
Beckers, Arnout; Thewissen, Maarten; Soree, Bart (2018) -
New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Asanovski, R.; Grill, Alexander; Franco, Jacopo; Palestri, P.; Beckers, Arnout; Kaczer, Ben; Selmi, L. (2022) -
Physical model of low-temperature to cryogenic threshold voltage in MOSFETs
Beckers, Arnout; Jaezeri, Farzan; Grill, Alexander; Narasimhamoorthy, Subramanian; Parvais, Bertrand; Enz, Christian (2020) -
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Beckers, Arnout; Michl, Jakob; Grill, Alexander; Kaczer, Ben; Garcia Bardon, Marie; Parvais, Bertrand; Govoreanu, Bogdan; De Greve, Kristiaan; Hiblot, Gaspard; Hellings, Geert (2023) -
Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
Grill, Alexander; John, Valentin; Michl, J.; Beckers, Arnout; Bury, Erik; Tyaginov, Stanislav; Parvais, Bertrand; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; Govoreanu, Bogdan (2022) -
Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
Asanovski, Ruben; Grill, Alexander; Franco, Jacopo; Palestri, Pierpaolo; Beckers, Arnout; Kaczer, Ben; Selmi, Luca (2023)