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A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
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Authors
Grill, Alexander
;
Michl, J.
;
Diaz Fortuny, Javier
;
Beckers, Arnout
;
Bury, Erik
;
Vaisman Chasin, Adrian
;
Grasser, T.
;
Waltl, M.
;
Kaczer, Ben
;
De Greve, Kristiaan
DOI
10.1109/JCS57290.2023.10102937
EISBN
979-8-3503-3252-0
ISSN
na
Conference
7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
Journal
na
Title
A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Publication type
Proceedings paper
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2
20.500.12860/42455.2
*
2023-11-28T09:05:29Z
validation by library/open access desk
1
20.500.12860/42455
2023-09-03T17:38:49Z
*Selected version
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