Browsing by author "Diaz Fortuny, Javier"
Now showing items 1-15 of 15
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A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Grill, Alexander; Michl, J.; Diaz Fortuny, Javier; Beckers, Arnout; Bury, Erik; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; De Greve, Kristiaan (2023) -
A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Bury, Erik; Vandemaele, Michiel; Kaczer, Ben; Degraeve, Robin (2022) -
A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies
Saraza-Canflanca, P.; Carrasco-Lopez, H.; Santana-Andreo, A.; Diaz Fortuny, Javier; Castro-Lopez, R.; Roca, E.; Fernandez, F. V. (2022) -
Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions
Sangani, Dishant; Diaz Fortuny, Javier; Bury, Erik; Kaczer, Ben; Gielen, G. (2022) -
Calibrated fast thermal calculation and experimental characterization of advanced BEOL stacks
Chang, Xinyue; Oprins, Herman; Lofrano, Melina; Cherman, Vladimir; Vermeersch, Bjorn; Diaz Fortuny, Javier; Park, Seongho; Tokei, Zsolt; De Wolf, Ingrid (2023) -
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, Javier; Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Rodriguez, Rosana; Castro-Lopez, Rafael; Roca, Elisenda; Fernandez, Francisco V.; Nafria, Montserrat (2023) -
Cyclic Thermal Effects on Devices of Two-Dimensional Layered Semiconducting Materials
Kim, Yeonsu; Kaczer, Ben; Verreck, Devin; Grill, Alexander; Kim, Doyoon; Song, Jaeick; Diaz Fortuny, Javier; Vici, Andrea; Park, Jongseon; Van Beek, Simon; Simicic, Marko; Bury, Erik; Vaisman Chasin, Adrian; Linten, Dimitri; Lee, Jaewoo; Chun, Jungu; Kim, Seongji; Seo, Beumgeun; Choi, Junhee; Shim, Joon Hyung; Lee, Kookjin; Kim, Gyu-Tae (2021) -
Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Vandemaele, Michiel; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2022) -
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation
Diaz Fortuny, Javier; Sangani, Dishant; Saraza Canflanca, Pablo; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2023) -
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
Sangani, Dishant; Diaz Fortuny, Javier; Bury, Erik; Franco, Jacopo; Kaczer, Ben; Gielen, Georges (2023) -
Modeling and Understanding the Compact Performance of h-BN Dual-Gated ReS2 Transistor
Lee, Kookjin; Choi, Junhee; Kaczer, Ben; Grill, Alexander; Lee, Jae Woo; Van Beek, Simon; Bury, Erik; Diaz Fortuny, Javier; Vaisman Chasin, Adrian; Lee, Jaewoo; Chun, Jungu; Shin, Dong Hoon; Na, Junhong; Cho, Hyeran; Lee, Sang Wook; Kim, Gyu-Tae (2021) -
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Saraza-Canflanca, Pablo; Rodriguez, Rosana; Martin-Martinez, Javier; Castro-Lopez, Rafael; Roca, Elisenda; V. Fernandez, Fancisco; Nafria, Montserrat; Diaz Fortuny, Javier (2021) -
The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology
Sangani, Dishant; Diaz Fortuny, Javier; Bury, Erik; Kaczer, Ben; Gielen, Georges (2023) -
Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Lofrano, Melina; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2023) -
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology
Saraza Canflanca, Pablo; Diaz Fortuny, Javier; Vici, Andrea; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2023)