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Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
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Authors
Sangani, Dishant
;
Diaz Fortuny, Javier
;
Bury, Erik
;
Franco, Jacopo
;
Kaczer, Ben
;
Gielen, Georges
DOI
10.1109/TDMR.2023.3288380
ISSN
1530-4388
Issue
3
Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume
23
Title
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
Publication type
Journal article
Embargo date
2023-06-21
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2
20.500.12860/42731.2
*
2024-04-25T08:23:53Z
validation by library/open access desk
1
20.500.12860/42731
2023-10-13T17:18:15Z
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