Browsing by author "Sangani, Dishant"
Now showing items 1-4 of 4
-
Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions
Sangani, Dishant; Diaz Fortuny, Javier; Bury, Erik; Kaczer, Ben; Gielen, G. (2022) -
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation
Diaz Fortuny, Javier; Sangani, Dishant; Saraza Canflanca, Pablo; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2023) -
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
Sangani, Dishant; Diaz Fortuny, Javier; Bury, Erik; Franco, Jacopo; Kaczer, Ben; Gielen, Georges (2023) -
The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology
Sangani, Dishant; Diaz Fortuny, Javier; Bury, Erik; Kaczer, Ben; Gielen, Georges (2023)