dc.contributor.author | Sangani, Dishant | |
dc.contributor.author | Diaz Fortuny, Javier | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Gielen, Georges | |
dc.date.accessioned | 2024-04-25T08:28:08Z | |
dc.date.available | 2023-10-13T17:18:15Z | |
dc.date.available | 2024-04-25T08:28:08Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1530-4388 | |
dc.identifier.other | WOS:001063339300006 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42731.2 | |
dc.source | WOS | |
dc.title | Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology | |
dc.type | Journal article | |
dc.contributor.imecauthor | Sangani, Dishant | |
dc.contributor.imecauthor | Diaz Fortuny, Javier | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Gielen, Georges | |
dc.contributor.orcidimec | Sangani, Dishant::0000-0002-1016-8654 | |
dc.contributor.orcidimec | Diaz Fortuny, Javier::0000-0002-8186-071X | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 2023-06-21 | |
dc.identifier.doi | 10.1109/TDMR.2023.3288380 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 346 | |
dc.source.endpage | 354 | |
dc.source.journal | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
dc.source.issue | 3 | |
dc.source.volume | 23 | |
imec.availability | Published - open access | |