Browsing by author "Grill, Alexander"
Now showing items 1-20 of 47
-
A Compact Physics Analytical Model for Hot-Carrier Degradation
Tyaginov, Stanislav; Grill, Alexander; Vandemaele, Michiel; Grasser, Tibor; Hellings, Geert; Makarov, Alexander; Jech, Markus; Linten, Dimitri; Kaczer, Ben (2020) -
A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Grill, Alexander; Michl, J.; Diaz Fortuny, Javier; Beckers, Arnout; Bury, Erik; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; De Greve, Kristiaan (2023) -
Analysis of the features of hot-carrier degradation in FinFETs
Makarov, Alexander; Tyaginov, Stanislav; Kaczer, Ben; Jech, Markus; Vaisman Chasin, Adrian; Grill, Alexander; Hellings, Geert; Vexler, Mikhail; Linten, Dimitri; Grasser, Tibor (2018-10) -
Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach
Makarov, Alexander; Kaczer, Ben; Vaisman Chasin, Adrian; Vandemaele, Michiel; Grill, Alexander; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Border trap based modeling of SiC transistor transfer characteristics
Tyaginov, Stanislav; Jech, Markus; Rzepa, Gerhard; Grill, Alexander; El-Sayed, Al-Moatasem; Pobegen, Gregor; Makarov, Alexander; Grasser, Tibor (2018) -
Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K
Asanovski, Ruben; Grill, Alexander; Franco, Jacopo; Palestri, P.; Mertens, Hans; Ritzenthaler, Romain; Horiguchi, Naoto; Kaczer, Ben; Selmi, L. (2024) -
CMOS Cryo-Electronics for Quantum Computing
Craninckx, Jan; Potocnik, Anton; Parvais, Bertrand; Grill, Alexander; Narasimhamoorthy, Subramanian; Van Winckel, Steven; Brebels, Steven; Mongillo, Massimo; Li, Roy; Govoreanu, Bogdan; Radu, Iuliana (2020) -
Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range
Tyaginov, Stanislav; Bury, Erik; Grill, Alexander; Yu, Zhuoqing; Makarov, Alexander; De Keersgieter, An; Vexler, Mikhail; Vandemaele, Michiel; Wang, Runsheng; Spessot, Alessio; Vaisman Chasin, Adrian; Kaczer, Ben (2023) -
Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Waldhoer, Dominic; Schleich, Christian; Michl, Jakob; Grill, Alexander; Claes, Dieter; Karl, Alexander; Knobloch, Theresia; Rzepa, Gerhard; Franco, Jacopo; Kaczer, Ben; Waltl, Michael; Grasser, Tibor (2023) -
Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study
Prasad, Divya; Vangala, Manoj; Bhargava, Mudit; Beckers, Arnout; Grill, Alexander; Tierno, Davide; Nathella, Krishnendra; Achuthan, Thanusree; Pietromonaco, David; Myers, James; Walker, Matthew; Parvais, Bertrand; Cline, Brian (2022) -
Cyclic Thermal Effects on Devices of Two-Dimensional Layered Semiconducting Materials
Kim, Yeonsu; Kaczer, Ben; Verreck, Devin; Grill, Alexander; Kim, Doyoon; Song, Jaeick; Diaz Fortuny, Javier; Vici, Andrea; Park, Jongseon; Van Beek, Simon; Simicic, Marko; Bury, Erik; Vaisman Chasin, Adrian; Linten, Dimitri; Lee, Jaewoo; Chun, Jungu; Kim, Seongji; Seo, Beumgeun; Choi, Junhee; Shim, Joon Hyung; Lee, Kookjin; Kim, Gyu-Tae (2021) -
Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Lee, Kookjin; Ji, Hyunjin; Kim, Yanghee; Kaczer, Ben; Lee, Hyebin; Ahn, Jae-Pyoung; Choi, Junhee; Grill, Alexander; Panarella, Luca; Smets, Quentin; Verreck, Devin; Van Beek, Simon; Vaisman Chasin, Adrian; Linten, Dimitri; Na, Junhong; Lee, Jae Woo; De Wolf, Ingrid; Kim, Gyu-Tae (2022) -
Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental
Michl, Jakob; Grill, Alexander; Waldhoer, Dominic; Goes, Wolfgang; Kaczer, Ben; Linten, Dimitri; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Grasser, Tibor; Waltl, Michael (2021) -
Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory
Michl, Jakob; Grill, Alexander; Waldhoer, Dominic; Goes, Wolfgang; Kaczer, Ben; Linten, Dimitri; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Waltl, Michael; Grasser, Tibor (2021) -
Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS
Michl, J.; Grill, Alexander; Stampfer, B.; Waldhoer, D.; Schleich, C.; Knobloch, T.; Ioannidis, E.; Enichlmair, H.; Minixhofer, R.; Kaczer, Ben; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Grasser, T.; Waltl, M. (2021) -
Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress
Lee, Kookjin; Kaczer, Ben; Kruv, Anastasiia; Gonzalez, Mario; Eneman, Geert; Okudur, Oguzhan Orkut; Grill, Alexander; De Wolf, Ingrid (2022) -
Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress
Lee, Kookjin; Kaczer, Ben; Kruv, Anastasiia; Gonzalez, Mario; Degraeve, Robin; Tyaginov, Stanislav; Grill, Alexander; De Wolf, Ingrid (2021) -
Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs
Lee, Kookjin; Kaczer, Ben; Kruv, Anastasiia; Gonzalez, Mario; Eneman, Geert; Okudur, Oguzhan Orkut; Grill, Alexander; De Wolf, Ingrid (2022) -
Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theory
Jech, Markus; Ulmann, Bianka; Rzepa, Gerhard; Tyaginov, Stanislav; Grill, Alexander; Waltl, Michael; Jabs, Dominic; Jungemann, Christoph; Grasser, Tibor (2019) -
Impact of the device geometric parameters on hot-carrier degradation in FinFETs
Tyaginov, Stanislav; Makarov, Alexander; Kaczer, Ben; Jech, Markus; Vaisman Chasin, Adrian; Grill, Alexander; Hellings, Geert; Vexler, Mikhail; Linten, Dimitri; Grasser, Tibor (2018)