Publication:

Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theory

Date

2019
Journal article
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40696.pdf 4.17 MB

Author(s)

Jech, Markus
;
Ulmann, Bianka
;
Rzepa, Gerhard
;
Tyaginov, Stanislav  
;
Grill, Alexander  
;
Waltl, Michael
;
Jabs, Dominic
;
Jungemann, Christoph
;
Grasser, Tibor

Journal

IEEE Transactions on Electron Devices

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