Authors

Jech, Markus; Ulmann, Bianka; Rzepa, Gerhard; Tyaginov, Stanislav; Grill, Alexander; Waltl, Michael; Jabs, Dominic; Jungemann, Christoph; Grasser, Tibor

ISSN

0018-9383

Issue

1

Journal

IEEE Transactions on Electron Devices

Volume

66

Title

Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theory

Publication type

Journal article

Embargo date

9999-12-31