Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theory

dc.contributor.author	Jech, Markus
dc.contributor.author	Ulmann, Bianka
dc.contributor.author	Rzepa, Gerhard
dc.contributor.author	Tyaginov, Stanislav
dc.contributor.author	Grill, Alexander
dc.contributor.author	Waltl, Michael
dc.contributor.author	Jabs, Dominic
dc.contributor.author	Jungemann, Christoph
dc.contributor.author	Grasser, Tibor
dc.contributor.imecauthor	Tyaginov, Stanislav
dc.contributor.imecauthor	Grill, Alexander
dc.contributor.orcidimec	Grill, Alexander::0000-0003-1615-1033
dc.date.accessioned	2021-10-27T10:55:58Z
dc.date.available	2021-10-27T10:55:58Z
dc.date.embargo	9999-12-31
dc.date.issued	2019
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/33222
dc.identifier.url	https://ieeexplore.ieee.org/document/8527641
dc.source.beginpage	241
dc.source.endpage	248
dc.source.issue	1
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	66
dc.title	Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theory
dc.type	Journal article
dspace.entity.type	Publication
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