Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach

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Author(s)

Makarov, Alexander

;

;

Vaisman Chasin, Adrian

;

Vandemaele, Michiel

;

Grill, Alexander

;

Hellings, Geert

;

El-Sayed, Al-Moatasem

;

;

Linten, Dimitri

;

Tyaginov, Stanislav

Journal

IEEE Electron Device Letters

Metrics

1985 since deposited on 2021-10-27

Acq. date: 2025-10-23