Authors

Makarov, Alexander; Kaczer, Ben; Vaisman Chasin, Adrian; Vandemaele, Michiel; Grill, Alexander; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav

ISSN

0741-3106

Issue

10

Journal

IEEE Electron Device Letters

Volume

40

Title

Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach

Publication type

Journal article