Publication:
Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach
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1999 since deposited on 2021-10-27
6last month
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Acq. date: 2026-08-03
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Statistics
Views
1999 since deposited on 2021-10-27
6last month
2last week
Acq. date: 2026-08-03
Citations