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Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
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Authors
Waldhoer, Dominic
;
Schleich, Christian
;
Michl, Jakob
;
Grill, Alexander
;
Claes, Dieter
;
Karl, Alexander
;
Knobloch, Theresia
;
Rzepa, Gerhard
;
Franco, Jacopo
;
Kaczer, Ben
;
Waltl, Michael
;
Grasser, Tibor
DOI
10.1016/j.microrel.2023.115004
ISSN
0026-2714
Issue
July
Journal
MICROELECTRONICS RELIABILITY
Volume
146
Title
Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Publication type
Journal article
Embargo date
2023-07-31
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2
20.500.12860/42076.2
*
2023-08-02T09:35:08Z
validation by library/open access desk
1
20.500.12860/42076
2023-06-23T20:39:03Z
*Selected version
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