Publication:

Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Date

2023
Journal article
https://doi.org/10.1016/j.microrel.2023.115004
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 2.83 MB

Author(s)

Waldhoer, Dominic
;
Schleich, Christian
;
Michl, Jakob
;
Grill, Alexander  
;
Claes, Dieter  
;
Karl, Alexander
;
Knobloch, Theresia
;
Rzepa, Gerhard
;
Franco, Jacopo  
;
Kaczer, Ben  
;
Waltl, Michael
;
Grasser, Tibor

Journal

MICROELECTRONICS RELIABILITY

Abstract

Description

Statistics

Downloads

339 since deposited on 2023-06-23
23last month
5last week
Acq. date: 2026-02-25

Views

1232 since deposited on 2023-06-23
1last month
Acq. date: 2026-02-25

Citations

Statistics

Downloads

339 since deposited on 2023-06-23
23last month
5last week
Acq. date: 2026-02-25

Views

1232 since deposited on 2023-06-23
1last month
Acq. date: 2026-02-25

Citations