Publication:

Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Date

2023
Journal article
https://doi.org/10.1016/j.microrel.2023.115004
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Author(s)

Waldhoer, Dominic
;
Schleich, Christian
;
Michl, Jakob
;
Grill, Alexander  
;
Claes, Dieter  
;
Karl, Alexander
;
Knobloch, Theresia
;
Rzepa, Gerhard
;
Franco, Jacopo  
;
Kaczer, Ben  
;
Waltl, Michael
;
Grasser, Tibor

Journal

MICROELECTRONICS RELIABILITY

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