Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Waldhoer, Dominic; Schleich, Christian; Michl, Jakob; Grill, Alexander; Claes, Dieter; Karl, Alexander; Knobloch, Theresia; Rzepa, Gerhard; Franco, Jacopo; Kaczer, Ben; Waltl, Michael; Grasser, Tibor

doi:10.1016/j.microrel.2023.115004

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Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

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2023

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https://doi.org/10.1016/j.microrel.2023.115004

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MICROELECTRONICS RELIABILITY

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419 since deposited on 2023-06-23

Acq. date: 2026-06-21

1235 since deposited on 2023-06-23

Acq. date: 2026-06-21

Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

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