Browsing by author "Claes, Dieter"
Now showing items 1-15 of 15
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Accelerated Capture and Emission (ACE) measurement pattern for efficient BTI characterization and modeling
Wu, Zhicheng; Franco, Jacopo; Claes, Dieter; Rzepa, Gerhard; Roussel, Philippe; Collaert, Nadine; Groeseneken, Guido; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2019) -
Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
Franco, Jacopo; de Marneffe, Jean-Francois; Vandooren, Anne; Kimura, Yosuke; Nyns, Laura; Wu, Zhicheng; El-Sayed, A-M; Jech, M.; Waldhoer, D.; Claes, Dieter; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Afanas'ev, V.; Stesmans, A.; Horiguchi, Naoto; Linten, Dimitri; Grasser, T.; Kaczer, Ben (2020) -
Chemical vapor deposition of monolayer-thin WS2 crystals from the WF6 and H2S precursors at low temperature
Groven, Benjamin; Claes, Dieter; Nalin Mehta, Ankit; Bender, Hugo; Vandervorst, Wilfried; Heyns, Marc; Caymax, Matty; Radu, Iuliana; Delabie, Annelies (2019) -
Comparative study of the growth behaviour of 2D WS2 by Atomic Layer Deposition (ALD) and Chemical Vapor Deposition (CVD), and the impact on the 2D crystal structure
Groven, Benjamin; Claes, Dieter; Heyne, Markus; Meersschaut, Johan; Nuytten, Thomas; Richard, Olivier; Bender, Hugo; Conard, Thierry; Verdonck, Patrick; Van Elshocht, Sven; Radu, Iuliana; Thean, Aaron; Heyns, Marc; Caymax, Matty; Delabie, Annelies (2016) -
Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Waldhoer, Dominic; Schleich, Christian; Michl, Jakob; Grill, Alexander; Claes, Dieter; Karl, Alexander; Knobloch, Theresia; Rzepa, Gerhard; Franco, Jacopo; Kaczer, Ben; Waltl, Michael; Grasser, Tibor (2023) -
Enhancing the quality of low temperature SiO2 by atomic hydrogen exposure for excellent NBTI reliability
Franco, Jacopo; de Marneffe, Jean-Francois; Vandooren, Anne; Kimura, Yosuke; Nyns, Laura; Wu, Zhicheng; El-Sayed, Al-Moatasem; Jech, Markus; Waldhoer, Dominic; Claes, Dieter; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Afanas'ev, Valeri; Stesmans, Andre; Horiguchi, Naoto; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2020) -
GdAlO3: a promising high-k dielectric for reliable gate stacks at low thermal budget
Claes, Dieter; Franco, Jacopo; Collaert, Nadine; Linten, Dimitri; Heyns, Marc (2018-12) -
Low thermal budget dual-dipole gate stacks engineered for sufficient BTI reliability in novel integration schemes
Franco, Jacopo; Wu, Zhicheng; Rzepa, Gerhard; Vandooren, Anne; Arimura, Hiroaki; Claes, Dieter; Horiguchi, Naoto; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2019-12) -
Low thermal budget PBTI and NBTI reliability solutions for multi-V-th CMOS RMG stacks based on atomic oxygen and hydrogen treatments
Franco, Jacopo; Arimura, Hiroaki; de Marneffe, Jean-Francois; Claes, Dieter; Brus, Stephan; Vandooren, Anne; Dentoni Litta, Eugenio; Horiguchi, Naoto; Croes, Kristof; Kaczer, Ben (2022) -
On the impact of reduced thermal budget on HfO2 electron trap and SiO2 hole trap defect bands in RMG gate stacks for sequential 3D CMOS integration
Franco, Jacopo; Wu, Zhicheng; Claes, Dieter; Vandooren, Anne; Horiguchi, Naoto; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2019) -
Positive bias temperature instability of HfO2-based gate stacks at reduced thermal budget for future CMOS technologies
Claes, Dieter; Franco, Jacopo; Collaert, Nadine; Linten, Dimitri; Heyns, Marc (2020) -
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies
Rzepa, G.; Karner, M.; Baumgartner, O.; Strof, G.; Schanovsky, F.; Mitterbauer, F.; Kernstock, C.; Karner, H. W.; Stanojevic, Z.; Weckx, Pieter; Hellings, Geert; Claes, Dieter; Wu, Zhicheng; Xiang, Yang; Chiarella, Thomas; Parvais, Bertrand; Mitard, Jerome; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2021) -
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks
Truijen, Brecht; O'Sullivan, Barry; Alam, Md Nur Kutubul; Claes, Dieter; Thesberg, M.; Roussel, Philippe; Vaisman Chasin, Adrian; Van den Bosch, Geert; Kaczer, Ben; Van Houdt, Jan (2022) -
Understanding and modelling the PBTI reliability of thin-film IGZO transistors
Vaisman Chasin, Adrian; Franco, Jacopo; Triantopoulos, Konstantinos; Dekkers, Harold; Rassoul, Nouredine; Belmonte, Attilio; Smets, Quentin; Subhechha, Subhali; Claes, Dieter; van Setten, Michiel; Mitard, Jerome; Delhougne, Romain; Afanasiev, Valeri; Kaczer, Ben; Kar, Gouri Sankar (2021) -
Wafer-Level LICCDM Device Testing
Simicic, Marko; Wu, Wei-Min; Claes, Dieter; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Chen, Shih-Hung (2021)