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Wafer-Level LICCDM Device Testing
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Authors
Simicic, Marko
;
Wu, Wei-Min
;
Claes, Dieter
;
Tamura, Shinichi
;
Shimada, Yohei
;
Sawada, Masanori
;
Chen, Shih-Hung
DOI
10.23919/EOS/ESD52038.2021.9574789
EISBN
978-1-58537-329-1
ISBN
978-1-58537-330-7
ISSN
0739-5159
Conference
43rd Annual EOS/ESD Symposium (EOS/ESD)
Journal
na
Research discipline
Electrical & electronic engineering
Title
Wafer-Level LICCDM Device Testing
Publication type
Proceedings paper
Embargo date
9999-12-31
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Conference contributions
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Version
Item
Date
Summary
3
20.500.12860/39751.3
*
2022-06-28T13:59:47Z
validation by library/open access desk
2
20.500.12860/39751.2
2022-05-16T07:38:44Z
validation by imec author
1
20.500.12860/39751
2022-05-05T02:17:41Z
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