Browsing by author "Shimada, Yohei"
Now showing items 1-4 of 4
-
Calibration and modeling of LICCDM setups
Simicic, Marko; Wu, Wei-Min; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Chen, Shih-Hung (2021) -
Low-impedance Contact CDM – Evaluation and Modeling
Simicic, Marko; Wu, Wei-Min; Chen, Shih-Hung; Jack, Nathan; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Linten, Dimitri (2019) -
Optimization of wafer-level low-impedance contact CDM testers
Simicic, Marko; Wu, Wei-Min; Jack, Nathan; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Chen, Shih-Hung (2020-11) -
Wafer-Level LICCDM Device Testing
Simicic, Marko; Wu, Wei-Min; Claes, Dieter; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Chen, Shih-Hung (2021)