Browsing by author "Sawada, Masanori"
Now showing items 1-20 of 29
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Calibrated wafer-level HBM measurements for quasi-static and transient device analysis
Scholz, Mirko; Thijs, Steven; Linten, Dimitri; Tremouilles, David; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Natarajan, M.I.; Groeseneken, Guido (2007) -
Calibration and modeling of LICCDM setups
Simicic, Marko; Wu, Wei-Min; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Chen, Shih-Hung (2021) -
Calibration of very fast TLP transients
Linten, Dimitri; Roussel, Philippe; Scholz, Mirko; Thijs, Steven; Griffoni, Alessio; Sawada, Masanori; Hasebe, Takumi; Groeseneken, Guido (2009-09) -
CDM ESD testing of a 3D TSV stacked IC chip
Nagata, Nagata; Takaya, Satoshi; Ikeda, Hiroaki; Linten, Dimitri; Scholz, Mirko; Chen, Shih-Hung; Hasegawa, Keiichi; Shintani, Taizo; Sawada, Masanori (2014-10) -
CDM protection of a 3D TSV memory IC with a 100 GB/s Wide I/O data bus
Nagata, Makoto; Takaya, Satoshi; Ikeda, Hiroaki; Linten, Dimitri; Scholz, Mirko; Chen, Shih-Hung; Hasegawa, Keiichi; Shintani, Taizo; Sawada, Masanori (2014-09) -
Comparison of system-level ESD design methodologies – towards the efficient and ESD robust design of systems
Scholz, Mirko; Chen, Shih-Hung; Vandersteen, Gerd; Linten, Dimitri; Hellings, Geert; Sawada, Masanori; Groeseneken, Guido (2013) -
ESD on-wafer characterization: Is TLP still the right measurement tool?
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep; Sawada, Masanori; Nakaie, T.; Hasebe, Takumi; Groeseneken, Guido (2009-10) -
Evaluation of co-design methodologies for ESD robust system design
Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Hellings, Geert; Sawada, Masanori (2014-10) -
Faster ESD device characterization with wafer-level HBM
Scholz, Mirko; Tremouilles, David; Linten, Dimitri; Rolain, Yves; Pintelon, Rik; Sawada, Masanori; Nakaei, Takumi; Hasebe, T.; Groeseneken, Guido (2007) -
HBM parameter extraction and transient safe operating area
Linten, Dimitri; Thijs, Steven; Griffoni, Alessio; Scholz, Mirko; Chen, Shih-Hung; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010-10) -
Impact of tester source impedance on HBM failure level
Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Johnsson, David; Groeseneken, Guido (2012) -
Improved calibration method for VFTLP transients
Thijs, Steven; Linten, Dimitri; Sawada, Masanori; Groeseneken, Guido (2011) -
Low-impedance Contact CDM – Evaluation and Modeling
Simicic, Marko; Wu, Wei-Min; Chen, Shih-Hung; Jack, Nathan; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Linten, Dimitri (2019) -
Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester
Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Johnsson, David; Gallerano, Antonio; Lafonteese, David; Concannon, Ann; Vandersteen, Gerd; Sawada, Masanori; Groeseneken, Guido (2012) -
Mixed-mode simulations for power-on ESD analysis
Scholz, Mirko; Shibkov, Andrei; Chen, Shih-Hung; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Vandersteen, Gerd; Groeseneken, Guido (2012) -
Mixed-mode simulations for power-on ESD analysis
Scholz, Mirko; Shibkov, Andrei; Chen, Shih-Hung; Linten, Dimitri; Sawada, Masanori; Vandersteen, Gerd; Groeseneken, Guido (2012-10) -
On-wafer human metal model measurements for system-level ESD analysis
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, P.; Groeseneken, Guido (2009-09) -
On-wafer human metal model measurements for system-level ESD analysis on component level
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Griffoni, Alessio; Sawada, Masanori; Nakaei, T; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, Peter; Meneghesso, Gaudenzio; Groeseneken, Guido (2009-10) -
On-wafer human metal model – system-level ESD stress on component level
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Groeseneken, Guido (2008-10) -
Optimization of wafer-level low-impedance contact CDM testers
Simicic, Marko; Wu, Wei-Min; Jack, Nathan; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Chen, Shih-Hung (2020-11)