ESD on-wafer characterization: Is TLP still the right measurement tool?

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Authors

Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep; Sawada, Masanori; Nakaie, T.; Hasebe, Takumi; Groeseneken, Guido

ISSN

0018-9456

Issue

10

Journal

IEEE Transactions on Instrumentation and Measurement

Volume

58

Title

ESD on-wafer characterization: Is TLP still the right measurement tool?

Publication type

Journal article

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