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On-wafer human metal model measurements for system-level ESD analysis on component level
Publication:
On-wafer human metal model measurements for system-level ESD analysis on component level
Date
2009-10
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Scholz, Mirko
;
Linten, Dimitri
;
Thijs, Steven
;
Griffoni, Alessio
;
Sawada, Masanori
;
Nakaei, T
;
Hasebe, Takumi
;
Lafonteese, David
;
Vashchenko, Vladislav
;
Vandersteen, Gerd
;
Hopper, Peter
;
Meneghesso, Gaudenzio
;
Groeseneken, Guido
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1969
since deposited on 2021-10-18
442
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1969
since deposited on 2021-10-18
442
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations