On-wafer human metal model measurements for system-level ESD analysis on component level

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Authors
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Griffoni, Alessio; Sawada, Masanori; Nakaei, T; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, Peter; Meneghesso, Gaudenzio; Groeseneken, Guido
Conference
RCJ ESD Symposium
Title
On-wafer human metal model measurements for system-level ESD analysis on component level
Publication type
Proceedings paper
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