Authors

Scholz, Mirko; Chen, Shih-Hung; Vandersteen, Gerd; Linten, Dimitri; Hellings, Geert; Sawada, Masanori; Groeseneken, Guido

ISSN

1530-4388

Issue

1

Journal

IEEE Transactions on Device and Materials Reliability

Volume

13

Title

Comparison of system-level ESD design methodologies – towards the efficient and ESD robust design of systems

Publication type

Journal article

Embargo date

9999-12-31