Faster ESD device characterization with wafer-level HBM

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Authors
Scholz, Mirko; Tremouilles, David; Linten, Dimitri; Rolain, Yves; Pintelon, Rik; Sawada, Masanori; Nakaei, Takumi; Hasebe, T.; Groeseneken, Guido
Conference
20th IEEE International Conference on Microelectronic Test Structures - ICMTS
Title
Faster ESD device characterization with wafer-level HBM
Publication type
Proceedings paper
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