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Faster ESD device characterization with wafer-level HBM
Publication:
Faster ESD device characterization with wafer-level HBM
Date
2007
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Scholz, Mirko
;
Tremouilles, David
;
Linten, Dimitri
;
Rolain, Yves
;
Pintelon, Rik
;
Sawada, Masanori
;
Nakaei, Takumi
;
Hasebe, T.
;
Groeseneken, Guido
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1958
since deposited on 2021-10-16
412
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1958
since deposited on 2021-10-16
412
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations