• Degradation mapping of IGZO TFTs 

  Rinaudo, P.; Chasin, A.; Franco, J.; Wu, Z.; Rassoul, N.; Delhougne, R.; Kaczer, B.; De Wolf, I.; Kar, G. S. (2022)

• Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions 

  Sangani, D.; Diaz-Fortuny, J.; Bury, E.; Kaczer, B.; Gielen, G. (2022)

• Misbehaviour Reporting in ETSI ITS Standard Considered Broken 

  Yoshizawa, Takahito; Preneel, Bart (2022)

• Multi-view Target Transformation for Pedestrian Detection 

  Lee, Wei-Yu; Jovanov, Ljubomir; Philips, Wilfried (2023)

• A Modular Approach to the Security Analysis of Two-Permutation Constructions 

  Chen, Yu Long (2022)

• Multi-domain Phase-field Modeling of Polycrystalline Hafnia-based (Anti-)ferroelectrics Capable of Representing Defects, Wake-up and Fatigue 

  Chang, Sou-Chi; Chae, Kisung; Popovici, Mihaela I.; Lin, Chia-Ching; Siddiqui, Saima; Tung, I-Cheng; Bizindavyi, Jasper; Alpizar, Bernal Granados; Haratipour, Nazila; Metz, Matthew; Kavalieros, Jack; Kar, Gouri S.; Kummel, Andrew; Cho, Kyeongjae; Avci, Uygar E. (2022)

• Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study 

  Prasad, Divya; Vangala, Manoj; Bhargava, Mudit; Beckers, Arnout; Grill, Alexander; Tierno, Davide; Nathella, Krishnendra; Achuthan, Thanusree; Pietromonaco, David; Myers, James; Walker, Matthew; Parvais, Bertrand; Cline, Brian (2022)

• New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications 

  Asanovski, R.; Grill, A.; Franco, J.; Palestri, P.; Beckers, A.; Kaczer, B.; Selmi, L. (2022)

• Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs 

  Abhinay, S.; Wu, W. -M.; Shih, C. -A.; Chen, S. -H.; Sibaja-Hernandez, A.; Parvais, B.; Peralagu, U.; Alian, A.; Wu, T. -L.; Ker, M. -D.; Groeseneken, G.; Collaert, N. (2022)

• The Nanopore-FET as a High-Throughput Barcode Molecule Reader for Single-Molecule Omics and Read-out of DNA Digital Data Storage 

  Martens, Koen; Barge, David; Liu, Lijun; Santermans, Sybren; Stoquart, Colin; Delport, Jacobus; Willems, Kherim; Ruic, Dino; Marion, Sanjin; Gevers, Juliette; Du Bois, Bert; Andrei, Alexandru; Lagae, Liesbet; Veugelers, Mark; Verhulst, Anne S.; Severi, Simone; Van Dorpe, Pol (2022)

• First demonstration of field-free perpendicular SOT-MRAM for ultrafast and high-density embedded memories 

  Cai, K.; Talmelli, G.; Fan, K.; Van Beek, S.; Kateel, V.; Gupta, M.; Monteiro, M. G.; Ben Chroud, M.; Jayakumar, G.; Trovato, A.; Rao, S.; Kar, G. S.; Couet, S. (2022)

• Colloidal quantum dot image sensors: a new vision for infrared 

  Malinowski, P. E.; Pejovic, Vladimir; Georgitzikis, Epimitheas; Kim, Joo Hyoung; Lieberman, Itai; Papadopoulos, Nikolas; Lim, Myung Jin; Hagelsieb, Luis Moreno; Chandrasekaran, Naresh; Puybaret, Renaud; Li, Yunlong; Verschooten, Tom; Thijs, Steven; Cheyns, David; Heremans, Paul; Lee, J. (2022)

• Insights into Scaled Logic Devices Connected from Both Wafer Sides 

  Veloso, A.; Eneman, G.; Matagne, P.; Vermeersch, B.; Jourdain, A.; Arimura, H.; O'Sullivan, B.; Chen, R.; De Keersgieter, A.; Simoen, E.; Radisic, D.; Oniki, Y.; Laffitte, A.; Brus, S.; Beyne, E.; Litta, E. Dentoni; Horiguchi, N. (2022)

• FinFETs with Thermally Stable RMG Gate Stack for Future DRAM Peripheral Circuits 

  Capogreco, E.; Arimura, H.; Ritzenthaler, R.; Brus, S.; Oniki, Y.; Dupuy, E.; Sebaai, F.; Radisic, D.; Chan, B. T.; Zhou, D.; Machkaoutsan, V.; Yoon, S.; Itokawa, H.; Yamaguchi, M.; Gao, Z.; Fazan, P.; Chen, Y.; Subramanian, S.; Ragnarsson, L. A.; Spessot, A.; Litta, E. Dentoni (2022)

• High performance La-doped HZO based ferroelectric capacitors by interfacial engineering 

  Popovici, M. I.; Bizindavyi, J.; Favia, P.; Clima, S.; Alam, Md. Nur K.; Ramachandran, R. K.; Walke, A. M.; Celano, U.; Leonhardt, A.; Mukherjee, S.; Richard, O.; Illiberi, A.; Givens, M.; Delhougne, R.; Van Houdt, J.; Kar, G. Sankar (2022)

• Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions 

  Yu, Hao; Parvais, B.; Peralagu, U.; ElKashlan, R. Y.; Rodriguez, R.; Khaled, A.; Yadav, S.; Alian, A.; Zhao, M.; Braga, N. de Almeida; Cobb, J.; Fang, J.; Cardinael, P.; Sibaja-Hernandez, A.; Collaert, N. (2022)

• OTS Physics-based Screening for Environment-friendly Selector Materials 

  Matsubayashi, D.; Clima, S.; Ravsher, T.; Garbin, D.; Delhougne, R.; Kar, G. S.; Pourtois, G. (2022)

• III-V/III-N technologies for next generation high-capacity wireless communication 

  Collaert, N.; Alian, A.; Banerjee, A.; Boccardi, G.; Cardinael, P.; Chauhan, V.; Desset, C.; ElKashlan, R.; Khaled, A.; Ingels, M.; Kunert, B.; Mols, Y.; O'Sullivan, B.; Peralagu, U.; Pinho, N.; Rodriguez, R.; Sibaja-Hernandez, A.; Sinha, S.; Sun, X.; Vais, A.; Vermeersch, B.; Yadav, S.; Yan, D.; Yu, H.; Zhang, Y.; Zhao, M.; Van Driessche, J.; Gramegna, G.; Wambacq, P.; Parvais, B.; Peeters, M. (2022)

• Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy 

  Wu, Z.; Chasin, A.; Franco, J.; Subhechha, S.; Dekkers, H.; Bhuvaneshwari, Y. V.; Belmonte, A.; Rassoul, N.; van Setten, M. J.; Afanas'ev, V.; Delhougne, R.; Kaczer, B.; Kar, G. S. (2022)

• Understanding the Cycling-Dependent Threshold Voltage Instability in OTS Devices 

  Yamaguchi, Marina; Degraeve, Robin; Garbin, Daniele; Clima, Sergiu; Ravsher, Taras; Matsubayashi, Daisuke; Tsukamoto, Takayuki; Delhougne, Romain; Goux, Ludovic; Kar, Gouri Sankar (2022)

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