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Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks
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Authors
Truijen, Brecht
;
O'Sullivan, Barry
;
Alam, Md Nur Kutubul
;
Claes, Dieter
;
Thesberg, M.
;
Roussel, Philippe
;
Vaisman Chasin, Adrian
;
Van den Bosch, Geert
;
Kaczer, Ben
;
Van Houdt, Jan
DOI
10.1109/IRPS48227.2022.9764603
EISBN
978-1-6654-7950-9
ISSN
1541-7026
Conference
IEEE International Reliability Physics Symposium (IRPS)
Journal
na
Title
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks
Publication type
Proceedings paper
Embargo date
9999-12-31
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2
20.500.12860/41176.2
*
2023-06-02T07:41:16Z
validation by library/open access desk
1
20.500.12860/41176
2023-02-27T03:28:20Z
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