Browsing by author "Truijen, Brecht"
Now showing items 1-17 of 17
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A BSIM-Based Predictive Hot-Carrier Aging Compact Model
Xiang, Yang; Tyaginov, Stanislav; Vandemaele, Michiel; Wu, Zhicheng; Franco, Jacopo; Bury, Erik; Truijen, Brecht; Parvais, Bertrand; Linten, Dimitri; Kaczer, Ben (2021) -
A physics-aware compact modeling framework for transistor aging in the entire bias space
Wu, Zhicheng; Franco, Jacopo; Roussel, Philippe; Tyaginov, Stanislav; Truijen, Brecht; Vandemaele, Michiel; Hellings, Geert; Collaert, Nadine; Groeseneken, Guido; Linten, Dimitri; Kaczer, Ben (2019) -
Advanced Current-Voltage Model of Electrical Contacts to GaAs- and Ge-Based Active Silicon Photonic Devices
Hsieh, Ping-Yi; O'Sullivan, Barry; Tsiara, Artemisia; Truijen, Brecht; Lagrain, Pieter; Wouters, Lennaert; Yudistira, Didit; Kunert, Bernardette; Van Campenhout, Joris; De Wolf, Ingrid (2023) -
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery
Bastos, Joao; O'Sullivan, Barry; Franco, Jacopo; Tyaginov, Stanislav; Truijen, Brecht; Vaisman Chasin, Adrian; Degraeve, Robin; Kaczer, Ben; Ritzenthaler, Romain; Capogreco, Elena; Dentoni Litta, Eugenio; Spessot, Alessio; Higashi, Yusuke; Yoon, Younggwang; Machkaoutsan, Vladimir; Fazan, Pierre; Horiguchi, Naoto (2022) -
Compact model of the entire I-V characteristic for accurate description of the asymmetric degradation of pMOSFETs during off-state stress
Truijen, Brecht; Franco, Jacopo; Roussel, Philippe; Linten, Dimitri (2019) -
Defect profiling in FEFET Si:HfO2 layers
O'Sullivan, Barry; Putcha, Vamsi; Izmailov, Roman; Afanas'ev, Valeri V.; Simoen, Eddy; Jung, Taehwan; Higashi, Yusuke; Degraeve, Robin; Truijen, Brecht; Kaczer, Ben; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Clima, Sergiu; Breuil, Laurent; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2020) -
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors
Croes, Kristof; Simons, Veerle; Truijen, Brecht; Roussel, Philippe; Van Sever, Koen; Tsiara, Artemisia; Franco, Jacopo; Absil, Philippe (2022) -
Dielectric Response in Ferroelectrics Near Polarization Switching: Analytical Calculations, First-Principles Modeling, and Experimental Verification
Clima, Sergiu; Verhulst, Anne; Bagul, Pratik; Truijen, Brecht; McMitchell, Sean; De Wolf, Ingrid; Pourtois, Geoffrey; Van Houdt, Jan (2022) -
Fundamental understanding of NBTI degradation mechanism in IGZO channel devices
Zhao, Ying; Rinaudo, Pietro; Vaisman Chasin, Adrian; Truijen, Brecht; Kaczer, Ben; Rassoul, Nouredine; Dekkers, Harold; Belmonte, Attilio; De Wolf, Ingrid; Kar, Gouri Sankar; Franco, Jacopo (2024) -
HfZrO ferroelectric characterization and parameterization of response to arbitrary excitation waveform
Alam, Md Nur Kutubul; Thesberg, Mischa; Kaczer, Ben; Roussel, Philippe; Vermeulen, Bart; Truijen, Brecht; Popovici, Mihaela Ioana; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Heyns, Marc; Van Houdt, Jan (2019) -
Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET
Wu, Zhicheng; Franco, Jacopo; Truijen, Brecht; Roussel, Philippe; Kaczer, Ben; Linten, Dimitri; Groeseneken, Guido (2021) -
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics
O'Sullivan, Barry; Truijen, Brecht; Putcha, Vamsi; Grill, Alexander; Vaisman Chasin, Adrian; Van den Bosch, Geert; Kaczer, Ben; Alam, Md Nur Kutubul; Van Houdt, Jan (2022) -
On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment
Thesberg, Mischa; Roussel; Stanojevic, Zlatan; Baumgartner, Oskar; Schanovsky, Franz; Karner, Markus; Kosina, Hans; Alam, Md Nur Kutubul; Truijen, Brecht; Kaczer, Ben (2022-06) -
Physical insights on steep slope FEFETs including nucleation-propagation and charge trapping
Xiang, Yang; Garcia Bardon, Marie; Alam, Md Nur Kutubul; Thesberg, Mischa; Kaczer, Ben; Roussel, Philippe; Popovici, Mihaela Ioana; Ragnarsson, Lars-Ake; Truijen, Brecht; Verhulst, Anne; Parvais, Bertrand; Horiguchi, Naoto; Groeseneken, Guido; Van Houdt, Jan (2019) -
Physics-based device aging modelling framework for accurate circuit reliability assessment
Wu, Zhicheng; Franco, Jacopo; Truijen, Brecht; Roussel, Philippe; Tyaginov, Stanislav; Vandemaele, Michiel; Bury, Erik; Groeseneken, Guido; Linten, Dimitri; Kaczer, Ben (2021) -
Single Event Latchup or Multi Event Latchup - How far can you push it?
Hellings, Geert; Truijen, Brecht; Simicic, Marko; Chen, Shih-Hung (2020) -
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks
Truijen, Brecht; O'Sullivan, Barry; Alam, Md Nur Kutubul; Claes, Dieter; Thesberg, M.; Roussel, Philippe; Vaisman Chasin, Adrian; Van den Bosch, Geert; Kaczer, Ben; Van Houdt, Jan (2022)